TOLIUPA, S.; SAMOKHVALOV, Y.; KHUSAINOV, P.; SHTANENKO, S. SELF-DIAGNOSIS AS A WAY TO INCREASE THE CYBER RESISTANCE OF TERMINAL COMPONENTS OF A TECHNOLOGICAL SYSTEM. Electronic Professional Scientific Journal «Cybersecurity: Education, Science, Technique», [S. l.], v. 2, n. 22, p. 134–147, 2023. DOI: 10.28925/2663-4023.2023.22.134147. Disponível em: https://csecurity.kubg.edu.ua/index.php/journal/article/view/536. Acesso em: 18 may. 2024.